Fringe pattern characterization by OPD analysis in a lateral shearing interferometric profilometer

dc.contributor.author	Frade Rodríguez, María
dc.contributor.author	Enguita González, José María
dc.contributor.author	Álvarez García, Ignacio
dc.contributor.author	Rodríguez Jiménez, Silvia
dc.date.accessioned	2013-01-30T10:22:34Z
dc.date.available	2013-01-30T10:22:34Z
dc.date.issued	2011
dc.identifier.citation	Optical Measurement Systems for Industrial Inspection Vii, 8082, (2011); doi:10.1117/12.889267	spa
dc.identifier.issn	0277-786X
dc.identifier.uri	http://hdl.handle.net/10651/11104
dc.language.iso	eng
dc.relation.ispartof	Optical Measurement Systems for Industrial Inspection Vii	spa
dc.source	WOK	spa
dc.title	Fringe pattern characterization by OPD analysis in a lateral shearing interferometric profilometer	spa
dc.type	journal article
dc.identifier.local	20111517	spa
dc.identifier.doi	10.1117/12.889267
dc.relation.publisherversion	http://dx.doi.org/10.1117/12.889267	spa

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