Analytical potential of rf-PGD-TOFMS for depth profiling of an oxidized thin film composite

dc.contributor.author	González Gago, Cristina
dc.contributor.author	Pisonero Castro, Jorge
dc.contributor.author	Sandín, R.
dc.contributor.author	Fuertes Martínez, José Félix
dc.contributor.author	Sanz Medel, Alfredo
dc.contributor.author	Bordel García, Nerea
dc.date.accessioned	2016-05-06T09:28:03Z
dc.date.available	2016-05-06T09:28:03Z
dc.date.issued	2016
dc.identifier.citation	Journal of Analytical Atomic Spectrometry, 31(1), p. 288-296 (2016); doi:10.1039/c5ja00104h
dc.identifier.issn	0267-9477
dc.identifier.uri	http://hdl.handle.net/10651/37071
dc.description.sponsorship	Spanish Ministry of Science [MAT2010-20921, CTQ2013-49032-C2-2 R]; Spanish Ministry of Economy and Competitiveness and Innovation; Principality of Asturias, "Plan de Ciencia, Tecnologia e innovacion" [FC-15-GRUPIN14-040]; Feder Program
dc.format.extent	p. 288-296
dc.language.iso	eng
dc.relation.ispartof	Journal of Analytical Atomic Spectrometry
dc.rights	©,
dc.source	Scopus
dc.source.uri	http://www.scopus.com/inward/record.url?eid=2-s2.0-84952887070&partnerID=40&md5=9c4ae363d18a432d023281dd4a153fea
dc.title	Analytical potential of rf-PGD-TOFMS for depth profiling of an oxidized thin film composite
dc.type	journal article
dc.identifier.doi	10.1039/c5ja00104h
dc.relation.projectID	MAT2010-20921
dc.relation.projectID	CTQ2013-49032-C2-2 R
dc.relation.projectID	FC-15-GRUPIN14-040
dc.relation.publisherversion	http://dx.doi.org/10.1039/c5ja00104h

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