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Automated dynamic inspection using active infrared thermography
dc.contributor.author | Usamentiaga Fernández, Rubén | |
dc.contributor.author | Mokhtari, Yacine | |
dc.contributor.author | Ibarra Castanedo, Clemente | |
dc.contributor.author | Klein, Matthieu | |
dc.contributor.author | Genest, Marc | |
dc.contributor.author | Maldague, Xabier | |
dc.date.accessioned | 2018-10-08T10:23:40Z | |
dc.date.available | 2018-10-08T10:23:40Z | |
dc.date.issued | 2018 | |
dc.identifier.citation | IEEE Transactions on Industrial Informatics, 14(12), p. 5648 - 5657 (2018); doi:10.1109/TII.2018.2836363 | |
dc.identifier.issn | 1551-3203 | |
dc.identifier.uri | http://hdl.handle.net/10651/48957 | |
dc.format.extent | p. 5648 - 5657 | |
dc.language.iso | eng | |
dc.relation.ispartof | IEEE Transactions on Industrial Informatics, 14 | |
dc.rights | © 2018 IEEE | |
dc.source | Scopus | |
dc.source.uri | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85047001845&doi=10.1109%2fTII.2018.2836363&partnerID=40&md5=ed0f75376bf2ddcec3060fe379bcf364 | |
dc.title | Automated dynamic inspection using active infrared thermography | |
dc.type | journal article | |
dc.identifier.doi | 10.1109/TII.2018.2836363 | |
dc.relation.publisherversion | http://dx.doi.org/10.1109/TII.2018.2836363 |
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